MISC

査読有り
2007年

MD study of damage structures with poly-atomic boron cluster implantation

Extended Abstracts of the 7th International Workshop on Junction Technology, IWJT 2007
  • Takaaki Aoki
  • ,
  • Toshio Seki
  • ,
  • Jiro Matsuo

開始ページ
23
終了ページ
24
記述言語
英語
掲載種別
DOI
10.1109/IWJT.2007.4279937

The MD simulations of B monomer and small cluster implantation were performed. The non-linear effect for implant range was observed when the incident energy is as low as few hundreds eV/atom, where the B10 or B18 cluster implantation gives deeper implantation energy and so higher implant efficiency of dopants than that of B monomer or dimer. For damage formation, cluster implantation caused large number of collisions at narrow surface region, which results in high-density amorphization of impact area. This amorphization effect was observed at both low and high energy cluster ion implantation, and is expected to reduce enhanced diffusion and show good annihilation process. ©2007 IEEE.

リンク情報
DOI
https://doi.org/10.1109/IWJT.2007.4279937
ID情報
  • DOI : 10.1109/IWJT.2007.4279937
  • SCOPUS ID : 47649105158

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