論文

査読有り
2002年

Cluster ion beam processing - METI/NEDO projects and recent progress

Proceedings of the International Conference on Ion Implantation Technology
  • Isao Yamada
  • ,
  • Jiro Matsuo
  • ,
  • Noriaki Toyoda

22-27-
開始ページ
661
終了ページ
664
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.1109/IIT.2002.1258092
出版者・発行元
Institute of Electrical and Electronics Engineers Inc.

Since the initial study of gas cluster ion beams (GCIB) was started in the Ion Beam Engineering Experimental Laboratory of Kyoto University, more than 15 years have passed. Some of the results of that study have already been applied for industrial use. Unique characteristics of gas cluster ion bombardment have been found to offer potential for various other industrial applications. The impact of an accelerated cluster ion upon a target surface imparts very high energy densities into the impact area and produces non-linear effects that are not associated with the impacts of atomic ions. Among prospective applications for these effects are included shallow ion implantation, high rate sputtering, surface cleaning and smoothing, and low temperature thin film formation.

リンク情報
DOI
https://doi.org/10.1109/IIT.2002.1258092
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000189388900168&DestApp=WOS_CPL
ID情報
  • DOI : 10.1109/IIT.2002.1258092
  • SCOPUS ID : 84961309748
  • Web of Science ID : WOS:000189388900168

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