渡邉騎通 (Norimichi Watanabe) - マイポータル

基本情報

所属: 神奈川大学工学部電気電子情報工学科助教 (特別助教)

J-GLOBAL ID: 202501007008643820
researchmap会員ID: R000082277

研究分野

ものづくり技術（機械・電気電子・化学工学） / 電子デバイス、電子機器 /

論文

Damage-free polymer surface modification employing inward-type plasma

Ryo Kanou, Hiroshi Suga, Hideyuki Utsumi, Satoshi Takahashi, Yuya Shirayama, Norimichi Watanabe, Stephane Petit and Tetsuo Shimizu

Japanese Journal of Applied Physics 56(8) 086201-1-086201-9 2017年7月査読有り
The investigation of the electrical contact resistance through thin oxide layer on a nanometer scale

Takahiro Yudate, Jun Toyoizumi, Masanori Onuma, Takaya Kondo, Kikuo Mori, Tetsuo Shimizu, Sumiko Kawabata, Norimichi Watanabe

Proceedings of THE 62nd IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS 60-64 2016年10月査読有り
Aging-treatment-induced soft magnetism in nickel-chromium-based superalloy X-750, Journal of Alloys and Compounds

Hiroaki Mamiya, Joanna Rabajczyk, Norimichi Watanabe, Agata Kowalska, Hideaki Kitazawa

Journal of Alloys and Compounds 681 367-373 2016年4月査読有り
Deviation From Fraunhofer-Type Modulation of Josephson Current Through Niobium Tunnel Junctions by Applying Vertical Magnetic Field

Akiyoshi Nakayama, Susumu Abe, Norimichi Watanabe

IEEE Transactions on Applied Superconductivity 26(3) 1100606 2016年3月査読有り
ナノマニピュレーターを用いたコネクタ接点における接触構造と接触抵抗変化の挙動解析

豊泉隼,近藤貴哉,大沼雅則,森喜久男,清水哲夫,川端澄子,渡邉騎通

電子情報通信学会技術研究報告機構デバイス研究会 115(455) 1-6 2016年2月
Investigation of Electrical Contacts on a Nanometer Scale using a Nano-manipulator in Scanning Electron Microscope

Takaya Kondo, Jun Toyoizumi, Masanori Onuma, Kikuo Mori, Tetsuo Shimizu, Sumiko Kawabata, Norimichi Watanabe

Proceedings of THE 61st IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS 262-265 2015年10月査読有り
Nanoscale Characterization of an Electron Emitting Tip by Field Emission Microscopy and Scanning Probe Microscopy

Norimichi Watanabe, Miyuki Tanaka, Tetsuo Shimizu

Journal of Vacuum Science & Technology B 33(5) 051809-1-051809-4 2015年9月査読有り
電界放射顕微鏡および走査プローブ顕微鏡による電子源の評価

渡邉騎通,田中深幸,清水哲夫

Journal of the Vacuum Society of Japan 58(4) 131-133 2015年5月査読有り
Two-dimensional magnetic field dependence of zero and finite voltage steps in current-voltage characteristics of superconducting quantum interference devices

Akiyoshi Nakayama, Susumu Abe, Yohei Nishi, Norimichi Watanabe, Yoichi Okabe

Microelectronic Engineering 146 19-25 2015年2月査読有り
The investigation of electrical contacts using newly designed nano-indentation manipulator in Scanning Electron Microscope

Tetsuo Shimizu, Tomoyuki Horie, Norimichi Watanabe, Jun Miyawaki, Shunjiro Fujii, Yoshinori Yamagata, Takaya Kondo, Masanori Onuma

Proceedings of THE SIXTIETH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS 403-406 2014年10月査読有り
Nanoscale characterization of an electron emitting tip by scanning probe microscopy

Norimichi Watanabe, Miyuki Tanaka, Tetsuo Shimizu

e-Journal of Surface Science and Nanotechnology 12 377-379 2014年8月査読有り
Modulation of a Josephson current through an Nb/Al-AlOx/Nb Josephson junction by a parallel magnetic field and a perpendicular magnetic field

Norimichi Watanabe, Susumu Abe, Akiyoshi Nakayama

Journal of Applied Physics 116 033920-1-033920-4 2014年7月査読有り
STM-SQUID microscopy using a fine probe

Norimichi Watanabe, Yuji Miyato, Hideo Itozaki

Proceedings of IEEE 14th International Superconductive Electronics Conference 2013年7月査読有り
Scanning SQUID probe microscope with STM and AFM

Yuji Miyato, Kouhei Hisayama, Yasunori Matsui, Norimichi Watanabe, Hideo Itozaki

Proceedings of IEEE 14th International Superconductive Electronics Conference 2013年7月査読有り
Anomalous modulation characteristics of DC Josephson current through niobium tunnel junction by applying external magnetic field 4000 A/m in perpendicular direction

Akiyoshi Nakayama, Susumu Abe, Norimichi Watanabe, Yoichi Okabe

Microelectronic Engineering 108 93-98 2013年3月査読有り
Two-dimensional magnetic field dependence of zero and finite voltage steps in current-voltage characteristics of rectangular shape niobium tunnel junctions

Akiyoshi Nakayama, Susumu Abe, Norimichi Watanabe, Yoichi Okabe

Microelectronic Engineering 108 163-168 2013年2月査読有り
Fine local magnetic structures measured by STM-SQUID microscopy

Norimichi Watanabe, Suguru Matsusawa, Yuji Miyato and Hideo Itozaki

Journal of the Magnetics Society of Japan 37(3-2) 235-238 2013年2月査読有り
STM-SQUID顕微鏡

渡邉騎通, 宮戸祐治, 糸崎秀夫

電子情報通信学会技術研究報告超伝導エレクトロニクス 112(408) 59-64 2013年1月
Fine probe for an STM-SQUID probe microscope

Norimichi Watanabe, Yuji Miyato, Suguru Matsusawa, Minoru Tachiki, Tadayuki Hayashi and Hideo Itozaki

IEEE Transactions on Applied Superconductivity 23(3) 1601804 2012年12月査読有り
High-Resolution Magnetic Field Measurement Using an STM-SQUID

Norimichi Watanabe, Yuji Miyato, Minoru Tachiki, Tadayuki Hayashi, Dongfeng He and Hideo Itozaki

Physics Procedia 36 300-305 2012年9月査読有り

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