2018年6月 Student Paper Award 2018 International Meeting for Future of Electron Devices Kansai (IMFEDK 2018) T. Nishitani, R. Yamaguchi, T. Yamazaki, J. T. Asubar, H. Tokuda, M. Kuzuhara タイトル Improved Current Collapse in AlGaN/GaN MOS-HEMTs with dual Field-Plates