Misc.

2020

A rapid screening method of target particles for TOF-SIMS analysis

Proceedings of the 38th Symposium on Materials Science and Engineering Research Center of Ion Beam Technology Hosei University
  • Hiyori Hoshino
  • Takeru Yoshida
  • Yuzuka Ohmori
  • Yuta Miyashita
  • Yue Zhao
  • Masato Morita
  • Tetsuo Sakamoto
  • Toshihide Kawai
  • Takeo Okumura
  • Hideki Tomita
  • Yukihiko Satou
  • Masabumi Miyabe
  • Ikuo Wakaida
    • … Display all
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