2002年11月
Time-domain terahertz spectrosopy of SrBi2Ta2O9 thin-films on MgO substrates
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
- ,
- ,
- 巻
- 41
- 号
- 11B
- 開始ページ
- 6803
- 終了ページ
- 6805
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1143/JJAP.41.6803
- 出版者・発行元
- INST PURE APPLIED PHYSICS
We measured the transmission spectra of terahertz wave through SrBi2Ta2O9 thin films on MgO substrate using time-domain, terahertz spectroscopy and evaluated optical and dielectric constants as a function of frequency in the range of 0.3-2.0 THz. The imaginary part of the dielectric function has peaks around 0.8 and 1.8 THz. The results are consistent with the results of Raman scattering measurements. The real part of the dielectric function is below 100 in the measured frequency range and is much smaller than the static dielectric constant. This result implies the existence of polarization components in a lower frequency range. [DOI: 10.1143/JJAP.41.6803]
- リンク情報
- ID情報
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- DOI : 10.1143/JJAP.41.6803
- ISSN : 0021-4922
- Web of Science ID : WOS:000182730300042