論文

2020年

Quantum de-trapping and transport of heavy defects in tungsten

Nature Materials
  • Kazuto Arakawa
  • Mihai Cosmin Marinica
  • Steven Fitzgerald
  • Laurent Proville
  • Duc Nguyen-Manh
  • Sergei L. Dudarev
  • Pui Wai Ma
  • Thomas D. Swinburne
  • Alexandra M. Goryaeva
  • Tetsuya Yamada
  • Takafumi Amino
  • Shigeo Arai
  • Yuta Yamamoto
  • Kimitaka Higuchi
  • Nobuo Tanaka
  • Hidehiro Yasuda
  • Tetsuya Yasuda
  • Hirotaro Mori
  • 全て表示

DOI
10.1038/s41563-019-0584-0
出版者・発行元
Springer Science and Business Media {LLC}

© 2020, The Author(s), under exclusive licence to Springer Nature Limited. The diffusion of defects in crystalline materials1 controls macroscopic behaviour of a wide range of processes, including alloying, precipitation, phase transformation and creep2. In real materials, intrinsic defects are unavoidably bound to static trapping centres such as impurity atoms, meaning that their diffusion is dominated by de-trapping processes. It is generally believed that de-trapping occurs only by thermal activation. Here, we report the direct observation of the quantum de-trapping of defects below around one-third of the Debye temperature. We successfully monitored the de-trapping and migration of self-interstitial atom clusters, strongly trapped by impurity atoms in tungsten, by triggering de-trapping out of equilibrium at cryogenic temperatures, using high-energy electron irradiation and in situ transmission electron microscopy. The quantum-assisted de-trapping leads to low-temperature diffusion rates orders of magnitude higher than a naive classical estimate suggests. Our analysis shows that this phenomenon is generic to any crystalline material.

リンク情報
DOI
https://doi.org/10.1038/s41563-019-0584-0
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85078482187&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85078482187&origin=inward
ID情報
  • DOI : 10.1038/s41563-019-0584-0
  • ISSN : 1476-1122
  • eISSN : 1476-4660
  • ORCIDのPut Code : 67985334
  • SCOPUS ID : 85078482187

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