2001年2月
Luminescent properties of SrAl2O4 : Eu thin films deposited by intense pulsed ion-beam evaporation
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
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- 巻
- 40
- 号
- 2B
- 開始ページ
- 1038
- 終了ページ
- 1041
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1143/JJAP.40.1038
- 出版者・発行元
- INST PURE APPLIED PHYSICS
SrAl2O4 activated with Eu, a long-phosphorescence material with high brightness, has been successfully deposited on Si substrates using intense pulsed ion-beam evaporation. Efficient preparation of long-phosphorescence thin films has been achieved using a high-density ablation plasma produced by the interaction of an intense pulsed ion-beam with the SrAl2O4:Eu target. The prepared SrAl2O4:Eu thin films had a polycrystalline structure without annealing and showed a typical photoluminescence of SrAl2O4:Eu at around 520 nm. Thermoluminescence (TL) measurements were carried out in order to obtain the lifetimes of the phosphorescence. In particular, TL spectra in the higher temperature region, which contributed to the long phosphorescence, were examined by the partial heating technique to evaluate the distributed trap depths and the lifetimes. The phosphorescence lifetime at 300 K for the prepared film was found to be about 180 min.
- リンク情報
- ID情報
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- DOI : 10.1143/JJAP.40.1038
- ISSN : 0021-4922
- Web of Science ID : WOS:000168355800030