Misc.

Peer-reviewed
2009

De-embedding of Board Parasitics with T-parameters for S-parameter Measurements of Integrated Circuits on PCB-Examinations in One-port Measurements

CEEM: 2009 5TH ASIA-PACIFIC CONFERENCE ON ENVIRONMENTAL ELECTROMAGNETICS
  • Kazuki Maeda
    • ,
  • Kengo Iokibe
    • ,
  • Yoshitaka Toyota
    • ,
  • Ryuji Koga
First page
246
Last page
249
Language
English
Publishing type
Publisher
IEEE
Link information
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000277506900061&DestApp=WOS_CPL
ID information
  • Web of Science ID : WOS:000277506900061
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