2015年8月 Microscopy&Microanalysis 2014 Birks Award Microanalysis Society H. Takahashi, N. Handa, T. Murano, M. Terauchi, M. Koike, T. Kawachi, T. Imazono, N. Hasegawa, M. Koeda, T. Nagano, H. Sasa, Y. Oue, Z. Yonezawa, S. Kuramoto タイトル Exciting possibilities of soft x-ray emission spectroscopy as chemical state analysis in EPMA and FE-SEM