論文

査読有り 責任著者
2021年8月26日

Fracture and Embedment Behavior of Brittle Submicrometer Spherical Particles Fabricated by Pulsed Laser Melting in Liquid Using a Scanning Electron Microscope Nanoindenter

Nanomaterials
  • Daizen Nakamura
  • ,
  • Naoto Koshizaki
  • ,
  • Nobuyuki Shishido
  • ,
  • Shoji Kamiya
  • ,
  • Yoshie Ishikawa

11
9
開始ページ
2201
終了ページ
2201
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.3390/nano11092201
出版者・発行元
MDPI AG

Generally, hard ceramic carbide particles, such as B4C and TiC, are angulated, and particle size control below the micrometer scale is difficult owing to their hardness. However, submicrometer particles (SMPs) with spherical shape can be experimentally fabricated, even for hard carbides, via instantaneous pulsed laser heating of raw particles dispersed in a liquid (pulsed laser melting in liquid). The spherical shape of the particles is important for mechanical applications as it can directly transfer the mechanical force without any loss from one side to the other. To evaluate the potential of such particles for mechanical applications, SMPs were compressed on various substrates using a diamond tip in a scanning electron microscope. The mechanical behaviors of SMPs were then examined from the obtained load–displacement curves. Particles were fractured on hard substrates, such as SiC, and fracture strength was estimated to be in the GPa range, which is larger than their corresponding bulk bending strength and is 10–40% of their ideal strength, as calculated using the density-functional theory. Contrarily, particles can be embedded into soft substrates, such as Si and Al, and the local hardness of the substrate can be estimated from the load–displacement curves as a nanoscale Brinell hardness measurement.

リンク情報
DOI
https://doi.org/10.3390/nano11092201
URL
https://www.mdpi.com/2079-4991/11/9/2201/pdf
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85113483413&origin=inward 本文へのリンクあり
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85113483413&origin=inward
ID情報
  • DOI : 10.3390/nano11092201
  • eISSN : 2079-4991
  • SCOPUS ID : 85113483413

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