Papers

Peer-reviewed International journal
Nov 26, 2018

Application of light trapping structure using Ge dot mask by alkaline etching to heterojunction solar cell

2018 IEEE 7th WCPEC Proceeding
  • Atsushi Hombe
  • ,
  • Yasuyoshi Kurokawa
  • ,
  • Kazuhiro Gotoh
  • ,
  • Noritaka Usami

First page
3097
Last page
3101
Language
English
Publishing type
Research paper (international conference proceedings)
DOI
10.1109/PVSC.2018.8547490
Publisher
IEEE

Heterojunction solar cells were fabricated with novel light trapping structure formed by selective etching using Ge dots as an etching mask. The light trapping structure has a lot of islands with submicron scale and nanoscale. Etching margin was less than 2 mu m. The light trapping structure was fabricated by changing the parameter of the Ge layer. As a result, the sample fabricated at the Ge coverage of 60 monolayers (MLs) had the largest island structure. The solar cell with the structure with Ge coverage of 60MLs showed high short-circuit current density of 39.7 mA/cm(2). This is because the novel light trapping structure consisted of submicron textures and nanoscale textures and enhanced the light absorption in a wide range.

Link information
DOI
https://doi.org/10.1109/PVSC.2018.8547490
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000469200403030&DestApp=WOS_CPL
URL
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85059881702&origin=inward
ID information
  • DOI : 10.1109/PVSC.2018.8547490
  • ISSN : 2159-2330
  • eISSN : 2159-2349
  • Web of Science ID : WOS:000469200403030

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