2021年12月10日
Robust Stability of Optical and Electronic Properties of Gallium‐Doped Zinc Oxide Thin Films to Gamma Ray Irradiation
physica status solidi (b)
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- 巻
- 2021
- 号
- 開始ページ
- 2100469
- 終了ページ
- 2100473
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1002/pssb.202100469
- 出版者・発行元
- Wiley-VCH GmBH
Through combined measurements of broadband optical spectroscopy (10 meV to 6 eV),electrical resistivity, and Hall effect, the effects of gamma ray irradiation on electronic and optical properties of gallium-doped ZnO (GZO) thin films, deposited by ion plating direct-current arc discharge, are investigated. A significant number of films, deposited at various discharge currents (ID¼ 100–200 A) and oxygen gas ow rates (OFR ¼ 0–25 sccm), exposed to doses of 15 and 30 kGy of gamma rays, are studied. The results indicate strong resilience of films to irradiation: visible range transparency is reduced by10–12% and the optical band gap shifts to lower energies by less than 3%, while electrical resistivity, carrier concentration, and electron mobility remain nearly unchanged.
- リンク情報
- ID情報
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- DOI : 10.1002/pssb.202100469
- ISSN : 0370-1972
- eISSN : 1521-3951