劉 昆洋

A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response 

2023 IEEE Custom Integrated Circuits Conference (CICC) 2023年4月  査読有り筆頭著者

V_SS-Bias-Based Measurement of Random Telegraph Noise in Hybrid SRAM PUF after Hot Carrier Injection Burn-in 

2023 35th International Conference on Microelectronic Test Structure (ICMTS) 2023年3月27日  査読有り筆頭著者

A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance 

ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) 2022年9月19日  査読有り筆頭著者

Statistical Modeling of SRAM PUF Cell Mismatch Shift Distribution After Hot Carrier Injection Burn-In 

2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) 2022年3月21日  査読有り筆頭著者

36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate through In-Cell Hot-Carrier Injection Burn-In 

Digest of Technical Papers - IEEE International Solid-State Circuits Conference 64 502-504 2021年2月13日  査読有り筆頭著者

A 373-F 0.21%-Native-BER EE SRAM Physically Unclonable Function with 2-D Power-Gated Bit Cells and {V}_{\text{SS } } Bias-Based Dark-Bit Detection 

IEEE Journal of Solid-State Circuits 55(6) 1719-1732 2020年6月  査読有り筆頭著者

A 0.5-V 2.07-fJ/b 497-F² EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in 

Proceedings of the Custom Integrated Circuits Conference 2020-March 2020年3月  査読有り筆頭著者

A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement 

IEEE Journal of Solid-State Circuits 56(7) 2193-2204 2020年  査読有り筆頭著者

A 373 F ² 2D Power-Gated EE SRAM Physically Unclonable Function with Dark-Bit Detection Technique 

2018 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018 - Proceedings 161-164 2018年12月14日  査読有り筆頭著者