2020年11月
Direct observation of Si (110)-(16×2) surface reconstruction by atomic force microscopy
Beilstein J. Nanotechnol
- ,
- ,
- ,
- ,
- ,
- 巻
- 11
- 号
- 0
- 開始ページ
- 1750
- 終了ページ
- 1756
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.3762/bjnano.11.157
- 出版者・発行元
- BEILSTEIN-INSTITUT
The atomic arrangement of the Si(110)-(16x2) reconstruction was directly observed using noncontact atomic force microscopy (NC-AFM) at 78 K. The pentagonal structure, which is the most important building block of the reconstruction, was concluded to consist of five atoms, while only four or five spots (depending on tip bias) have been reported with scanning tunneling microscopy (STM). Single atoms were determined to exist near step edges between upper and lower terraces, which have not been reported using STM. These findings are key evidence for establishing an atomic model of the Si(110)-(16x2) reconstruction, which indeed has a complex structure.
- リンク情報
- ID情報
-
- DOI : 10.3762/bjnano.11.157
- ISSN : 2190-4286
- Web of Science ID : WOS:000592242400001