論文

査読有り 責任著者
2020年11月

Direct observation of Si (110)-(16×2) surface reconstruction by atomic force microscopy

Beilstein J. Nanotechnol
  • Tatsuya Yamamoto
  • ,
  • Ryo Izumi
  • ,
  • Kazushi Miki
  • ,
  • Takahiro Yamasaki
  • ,
  • Yasuhiro Sugawara
  • ,
  • Yan Jun Li

11
0
開始ページ
1750
終了ページ
1756
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.3762/bjnano.11.157
出版者・発行元
BEILSTEIN-INSTITUT

The atomic arrangement of the Si(110)-(16x2) reconstruction was directly observed using noncontact atomic force microscopy (NC-AFM) at 78 K. The pentagonal structure, which is the most important building block of the reconstruction, was concluded to consist of five atoms, while only four or five spots (depending on tip bias) have been reported with scanning tunneling microscopy (STM). Single atoms were determined to exist near step edges between upper and lower terraces, which have not been reported using STM. These findings are key evidence for establishing an atomic model of the Si(110)-(16x2) reconstruction, which indeed has a complex structure.

リンク情報
DOI
https://doi.org/10.3762/bjnano.11.157
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000592242400001&DestApp=WOS_CPL
ID情報
  • DOI : 10.3762/bjnano.11.157
  • ISSN : 2190-4286
  • Web of Science ID : WOS:000592242400001

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