Jan, 2003
Fluorescence extended X-ray absorption fine structure analysis of half-metallic ferromagnet "zinc-blende CrAs" grown on GaAs by molecular beam epitaxy
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
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- Volume
- 199
- Number
- First page
- 227
- Last page
- 230
- Language
- English
- Publishing type
- Research paper (scientific journal)
- DOI
- 10.1016/S0168-583X(02)01539-2
- Publisher
- ELSEVIER SCIENCE BV
In this work, geometric structures for a half-metallic ferromagnet "zinc-blende CrAs", which showed ferromagnetic behavior beyond room temperature, were investigated using fluorescence extended X-ray absorption fine structure (EXAFS) measurement. The EXAFS measurements revealed that As atoms around Cr atoms in the 2 nm CrAs film grown on a GaAs(O 0 1) substrate were coordinated tetrahedrally, indicating formation of zinc-blende CrAs. The Cr-As bond length in the zinc-blende CrAs is 2.49 Angstrom This value is close to that which was estimated from the lattice constant (5.82 Angstrom) of ferromagnetic zinc-blende CrAs calculated by full-potential linearized augmented-plane wave method. The EXAFS analysis show that the theoretically predicted zinc-blende CrAs can be fabricated on GaAs(O 0 1) substrate by low-temperature molecular-beam epitaxy. (C) 2002 Elsevier Science B.V. All rights reserved.
- Link information
- ID information
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- DOI : 10.1016/S0168-583X(02)01539-2
- ISSN : 0168-583X
- eISSN : 1872-9584
- Web of Science ID : WOS:000180925400045