2008年
Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification
2008 ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2
- ,
- ,
- 巻
- pp. 107-108
- 号
- 開始ページ
- 7
- 終了ページ
- 8
- 記述言語
- 英語
- 掲載種別
- 出版者・発行元
- IEEE
This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructed with standard cells, and thus can be easily embedded in SoCs for design verification. The performance of the gated oscillator is verified with fabricated test chips in a 90nm process.
- リンク情報
- ID情報
-
- Web of Science ID : WOS:000257065100004