論文

査読有り
2005年12月

On-chip Thermal Gradient Analysis and Temperature Flattening for SoC Design

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
  • T. Sato
  • ,
  • J. Ichimiya
  • ,
  • N. Ono
  • ,
  • K. Hachiya
  • ,
  • M. Hashimoto

E88-A
12
開始ページ
3382
終了ページ
3389
記述言語
英語
掲載種別
DOI
10.1093/ietfec/e88-a.12.3382
出版者・発行元
一般社団法人電子情報通信学会

This paper quantitatively analyzes thermal gradient of SoC and proposes a thermal flattening procedure. First, the impact of dominant parameters, such as area occupancy of memory/logic block, power density, and floorplan on thermal gradient are studied quantitatively. Temperature difference is also evaluated from timing and reliability standpoints. Important results obtained here are 1) the maximum temperature difference increases with higher memory area occupancy and 2) the difference is very floorplan sensitive. Then, we propose a procedure to amend thermal gradient. A slight floorplan modification using the proposed procedure improves on-chip thermal gradient significantly.

リンク情報
DOI
https://doi.org/10.1093/ietfec/e88-a.12.3382
CiNii Articles
http://ci.nii.ac.jp/naid/110004019440
CiNii Books
http://ci.nii.ac.jp/ncid/AA10826239
ID情報
  • DOI : 10.1093/ietfec/e88-a.12.3382
  • ISSN : 0916-8508
  • CiNii Articles ID : 110004019440
  • CiNii Books ID : AA10826239

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