2007年
Quantitative prediction of on-chip capacitive and inductive crosstalk noise and discussion on wire cross-sectional area toward inductive crosstalk free interconnects
PROCEEDINGS 2006 INTERNATIONAL CONFERENCE ON COMPUTER DESIGN
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- 開始ページ
- 70
- 終了ページ
- 75
- 記述言語
- 英語
- 掲載種別
- 研究論文(国際会議プロシーディングス)
- 出版者・発行元
- IEEE
Capacitive and inductive crosstalk noises are expected to be more serious in advanced technologies. However, capacitive and inductive crosstalk noises in the future have not been concurrently and sufficiently discussed quantitatively, though capacitive crosstalk noise has been intensively studied solely as a primary factor of interconnect delay variation. This paper quantitatively predicts the impact of capacitive and inductive crosstalk in prospective processes, and reveals that interconnect scaling strategies strongly affect relative dominance between capacitive and inductive coupling. Our prediction also makes the point that the interconnect resistance significantly influences both inductive coupling noise and propagation delay. We then evaluate a tradeoff between wire cross-sectional area and worst-case propagation delay focusing on inductive coupling noise, and show that an appropriate selection of wire cross-section can reduce delay uncertainty by the small sacrifice of propagation delay.
- リンク情報
- ID情報
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- ISSN : 1063-6404
- Web of Science ID : WOS:000252361000013