論文

2022年9月1日

Optimal gate selection method for simultaneous lifetime-based measurement of PSP and TSP

Measurement Science and Technology
  • Miku Kasai
  • ,
  • Takayuki Nagata
  • ,
  • Taku Nonomura
  • ,
  • Yuji Saito
  • ,
  • Keisuke Asai

33
9
開始ページ
095203
終了ページ
095203
記述言語
掲載種別
研究論文(学術雑誌)
DOI
10.1088/1361-6501/ac769b
出版者・発行元
IOP Publishing

Abstract

In this study, a new method that optimizes a measurement condition in a lifetime-based simultaneous measurement of a pressure-sensitive paint (PSP) and a temperature-sensitive paint (TSP) is proposed for the improvement of the accuracy of the pressure measurement. An optimal gate is selected based on a pressure measurement error when calculating the pressure and the temperature simultaneously from measurement values of a PSP and a TSP. A shot noise of a PSP, a temperature error, and a fluctuation in an emission intensity ratio due to blurring were considered error factors of the PSP measurement. The pressure measurement error propagated from each error source was considered as an evaluation index in an optimization of a measurement condition. We evaluated 17 types of TSP characteristics and selected an optimal TSP and a measurement condition for the PSP measurement. Further, the optimized measurement condition was evaluated in a PSP/TSP simultaneous measurement using a coupon-based test. The optimal measurement condition obtained based on the proposed method and an empirical selection method were compared by a PSP/TSP simultaneous measurement using a coupon-based test. A small-pressure measurement error, i.e. high pressure-measurement accuracy, was realized by the proposed method in the simultaneous lifetime-based method of a PSP and a TSP. In addition to the analyses above, the blurring effects were found to be minor and briefly summarized in appendices.

リンク情報
DOI
https://doi.org/10.1088/1361-6501/ac769b
URL
https://iopscience.iop.org/article/10.1088/1361-6501/ac769b
URL
https://iopscience.iop.org/article/10.1088/1361-6501/ac769b/pdf
ID情報
  • DOI : 10.1088/1361-6501/ac769b
  • ISSN : 0957-0233
  • eISSN : 1361-6501
  • ORCIDのPut Code : 114135384

エクスポート
BibTeX RIS