Yousuke Miyake

J-GLOBAL         Last updated: Nov 10, 2017 at 15:29
 
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Name
Yousuke Miyake
Affiliation
Kyushu Institute of Technology
Section
Faculty of Computer Science and Systems Engineering Department of Creative Informatics

Research Areas

 
 

Published Papers

 
On the effects of real time and contiguous measurement with a digital temperature and voltage sensor
Yousuke Miyake, Yasuo Sato, and Seiji Kajihara
Proc. IEEE International Test Conference in Asia   125-130   Sep 2017   [Refereed]
Measurement of On-Chip Temperature and Voltage Variation Using Digital Sensors
Yousuke Miyake, Yasuo Sato, and Seiji Kajihara
Proc. IEEE Workshop on RTL and High Level Testing   66-71   Nov 2016   [Refereed]
Miyake Y, Sato Y, Kajihara S, Miura Y.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems   24(11) 3282-3295   2016   [Refereed]
Kajihara S, Miyake Y, Sato Y, Miura Y.
Proceedings of the Asian Test Symposium   254-257   2014   [Refereed]
Sato Y, Monden M, Miyake Y, Kajihara S.
Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC   59-67   2014   [Refereed]
Miyake Y, Sato Y, Kajihara S, Miura Y.
Proceedings of the Asian Test Symposium   156-161   2014   [Refereed]
A Flexible Temperature and Voltage Monitor for Field Test
Yousuke Miyake, Yasuo Sato, Seiji Kajihara and Yukiya Miura
Proc. IEEE Workshop on RTL and High Level Testing      Nov 2013   [Refereed]
Miura Y, Sato Y, Miyake Y, Kajihara S.
Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012      2012   [Refereed]

Misc

 
Yousuke Miyake, Yasuo Sato, and Seiji Kajihara
IEICE technical report   117(154) 19-24   Jul 2017
三宅 庸資, 加藤 隆明, 糸永 卓矢
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報   115(382) 5-10   Dec 2015
喜納 猛, 三宅 庸資, 佐藤 康夫
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報   115(339) 165-170   Dec 2015
A Fully-digital Temperature Monitor Using Ring Oscillator on FPGA
Yousuke Miyake, Yasuo Sato, and Seiji Kajihara
2015 205-210   Aug 2015
SATO Yasuo, MIYAKE Yousuke, KAJIHARA Seiji
IEICE technical report. Dependable computing   114(384) 1-6   Dec 2014
Ring oscillators are used for variety of applications to enhance reliability on LSIs or FPGAs; however, the performance degradation caused by physial aging phenomena such as NBTI is becoming a crucial issue. This paper proposes a design technology...
MIYAKE Yousuke, SATO Yasuo, KAJIHARA Seiji
IEICE technical report. Dependable computing   114(384) 7-12   Dec 2014
On-chip temperature monitors are often used to guarantee the reliability of VLSIs and monitors using ring oscillators have been proposed. When the temperature monitors are implemented in FPGA, estimation accuracy will be varied much by a large amo...
ABE Kentaro, MIYAKE Yousuke, KAJIHARA Seiji, SATO Yasuo
IEICE technical report. Dependable computing   114(329) 245-250   Nov 2014
This paper describes an on-chip delay measurement method that targets a logic circuit on an FPGA. While advances in semiconductor technology bring miniaturization and performance improvement of the circuit, failures due to the delay degradation by...
SATO Yasuo, MATSUURA Munehiro, ARAKAWA Hitoshi, MIYAKE Yousuke, KAJIHARA Seiji
IEICE technical report. Dependable computing   113(353) 7-12   Dec 2013
This paper proposes a variable test-timing generation method that should be used for built-in self-test on FPGA. Application-dependent test for FPGA targets quality improvement in silicon debug or online test; however, as it requires reconfigurati...
MIYAKE Yousuke, MONDEN Masafumi, SATO Yasuo, KAJIHARA Seiji
IEICE technical report. Dependable computing   113(321) 165-170   Nov 2013
FPGAs are used in various embedded systems including highly reliable systems, therefore, it is important to ensure its reliability. Temperature monitors using ring oscillators are often used to guarantee the reliability of VLSIs; however, the esti...
KATO Takaaki, KINA Takeru, MIYAKE Yousuke, SATO Yasuo, KAJIHARA Seiji
IEICE technical report. Dependable computing   113(321) 233-238   Nov 2013
Power reduction during testing with Logic BIST is a crucial problem; however, power controlling techniques are required as well as power reduction techniques because the required power level differs depending on its applications. The authors' prev...
MIYAKE Yousuke, TSUMORI Wataru, SATO Yasuo, KAJIHARA Seui, MIURA Yukiya
IEICE technical report. Dependable computing   112(429) 55-60   Feb 2013
Delay increase due to aging phenomena is a critical issue of VLSIs For detecting such increase in field, a highly accurate delay measurement technology that considers the influence by temperature and voltage is strongly needed A method has been pr...
TSUMORI Wataru, MIYAKE Yousuke, SATO Yasuo, KAJIHARA Seiji, MIURA Yukiya
IEICE technical report. Dependable computing   112(321) 243-248   Nov 2012
For improving reliability of LSIs, the delay increase caused by aging during system operation should be detected before a system failure occurs. Such a delay increase can be detected by repeatedly measuring a circuit delay in field. However, the m...
MIYAKE Yousuke, SASAKAWA Takuma, SATO Yasuo, KAJIHARA Seiji, MIURA Yukiya
IEICE technical report. Dependable computing   112(102) 45-50   Jun 2012
Delay increase due to aging phenomena is a critical issue of VLSIs. For detecting such increase in field, highly accurate delay measurement that considers the influence by temperature and voltage is strongly needed. Therefore, we developed a TEG, ...
MIYAKE Yousuke, SATO Yasuo, KAJIHARA Seiji, MIYASE Kohei, MIURA Yukiya
IEICE technical report. Dependable computing   111(435) 61-66   Feb 2012
High dependability is required for an embedded system VLSI. High functionality and high performance of VLSI, due to the miniaturization of the manufacturing process, increase a performance deterioration caused by various aging mechanisms of VLSI c...