2014年11月
Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor for Field Test
Proc. IEEE Asian Test Symposium (ATS)
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- 開始ページ
- 156
- 終了ページ
- 161
- 記述言語
- 英語
- 掲載種別
- 研究論文(国際会議プロシーディングス)
- DOI
- 10.1109/ATS.2014.38
- 出版者・発行元
- IEEE
Field test is performed in diverse environments, in which temperature varies across a wide range. As temperature affects a circuit delay greatly, accurate temperature monitors are required. They should be placed at various locations on a chip including hot spots. This paper proposes a flexible ring-oscillator-based monitor that accurately measures voltage as well as temperature at the same time. The measurement accuracy was confirmed by circuit simulation for 180 nm, 90 nm and 45 nm technologies. An experiment using test chips with 180 nm technology shows its feasibility.
- リンク情報
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- DOI
- https://doi.org/10.1109/ATS.2014.38
- Web of Science
- https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000380895400026&DestApp=WOS_CPL
- URL
- http://www.scopus.com/inward/record.url?eid=2-s2.0-84919963283&partnerID=MN8TOARS
- URL
- http://hdl.handle.net/10228/00006259 本文へのリンクあり
- ID情報
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- DOI : 10.1109/ATS.2014.38
- ISSN : 1081-7735
- ORCIDのPut Code : 34940242
- SCOPUS ID : 84919963283
- Web of Science ID : WOS:000380895400026