2015年8月
Improvements in fundamental performance of liquid-environment atomic force microscopy with true atomic resolution
JAPANESE JOURNAL OF APPLIED PHYSICS
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- 巻
- 54
- 号
- 8
- 開始ページ
- 08LA03
- 終了ページ
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.7567/JJAP.54.08LA03
- 出版者・発行元
- IOP PUBLISHING LTD
Recently, there have been significant advancements in liquid-environment atomic force microscopy (AFM) with true atomic resolution. The technical advancements are followed by a rapid expansion of its application area. Examples include subnanometer-scale imaging of biological systems and three-dimensional measurements of water distributions (i.e., hydration structures) and fluctuating surface structures. However, to continue this progress, we should improve the fundamental performance of liquid-environment dynamic-mode AFM. The present AFM technique does not allow real-time imaging of atomic-scale dynamic phenomena at a solid-liquid interface. This has hindered atomic-level understanding of crystal growth and dissolution, catalytic reactions and metal corrosion processes. Improvement in force sensitivity is required not only for such a high-speed imaging but also for various surface property measurements using a high-resolution AFM technique. In this review, we summarize recent works on the improvements in the force sensitivity and operation speed of atomic-resolution dynamic-mode AFM for liquid-environment applications. (C) 2015 The Japan Society of Applied Physics
- リンク情報
- ID情報
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- DOI : 10.7567/JJAP.54.08LA03
- ISSN : 0021-4922
- eISSN : 1347-4065
- Web of Science ID : WOS:000358663300004