2013年6月
X-ray residual stress measurements correlated with weld microstructure characteristics
ASM Proceedings of the International Conference: Trends in Welding Research
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- 開始ページ
- 184
- 終了ページ
- 192
- 記述言語
- 英語
- 掲載種別
- 出版者・発行元
- ASM INTERNATIONAL
X-ray diffraction measurement of residual stresses on the surface is of great importance particularly when crack initiation needs to be evaluated for welded components. The measurement with laboratory X-ray is however known to produce markedly different stress results than mechanical methods because the microstructures in the welds change during the welding thermal cycle. Weld metallurgical evaluation for measurement accuracy and stress distribution is a key factor, and the relationship between the microstructure and stresses obtained by X-ray diffraction is evaluated. Materials should be classified according to the accuracy of residual stress measurement by X-ray diffraction. Copyright © 2013 ASM International® All rights reserved.
- リンク情報
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- Web of Science
- https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000325662400025&DestApp=WOS_CPL
- Scopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84880684072&origin=inward
- Scopus Citedby
- https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=84880684072&origin=inward
- ID情報
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- SCOPUS ID : 84880684072
- Web of Science ID : WOS:000325662400025