論文

査読有り
2008年9月

Transport losses in single and assembled coated conductors with textured-metal substrate with reduced magnetism

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS
  • N. Amemiya
  • ,
  • Z. Jiang
  • ,
  • Z. Li
  • ,
  • M. Nakahata
  • ,
  • T. Kato
  • ,
  • M. Ueyama
  • ,
  • N. Kashima
  • ,
  • S. Nagaya
  • ,
  • S. Shiohara

468
15-20
開始ページ
1718
終了ページ
1722
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.physc.2008.05.277
出版者・発行元
ELSEVIER SCIENCE BV

Transport losses in a coated conductor with a textured-metal substrate with reduced magnetism were studied experimentally. The substrate is with a clad structure, and HoBCO superconductor layer is deposited on the substrate with buffer layers. The measured transport loss of a sample whose critical current is 126.0 A falls between Norris's strip value and Norris's ellipse value. The increase in the measured transport loss from Norris's strip value can be attributed to its non-uniform lateral J(c) distribution. The same buffered clad tape was placed under an IBAD-MOCVD coated conductor with a non-magnetic substrate, and its transport loss was measured. The comparison between the measured transport loss of this sample and that of the identical IBAD-MOCVD coated conductor without the buffered clad tape indicates that the increase in the transport loss due to this buffered clad tape is small, The transport losses of hexagonal assemblies of IBAD-MOCVD coated conductors. whose structure simulates that of superconducting power transmission cables, were also measured where the buffered clad tapes were under-lied or over-lied on the coated conductors. The increase in the transport loss of hexagonal assemblies of coated conductors due to the buffered clad tapes is at an allowable level. (C) 2008 Published by Elsevier B.V.

リンク情報
DOI
https://doi.org/10.1016/j.physc.2008.05.277
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000259712900157&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/j.physc.2008.05.277
  • ISSN : 0921-4534
  • Web of Science ID : WOS:000259712900157

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