2016年2月
Surface phonon excitation on clean metal surfaces in scanning tunneling microscopy
PHYSICAL REVIEW B
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- 巻
- 93
- 号
- 8
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1103/PhysRevB.93.085411
- 出版者・発行元
- AMER PHYSICAL SOC
We carry out inelastic electron tunneling spectroscopy (IETS) measurement on a clean Cu(110) surface at 2 K using a scanning tunneling microscope (STM). The spectrum exhibits a single peak at 6 meV, while the phonon density of states (DOS) cannot explain the appearance of this peak. In order to elucidate the origin of the observed peak, we derive a general expression of STM-IETS spectrum for the phonon excitation at a clean metal surface by employing the Keldysh-Green's functional theory. We reveal that the STM-IETS spectrum is proportional to the momentum-resolved Eliashberg function, and not solely to the phonon DOS. By ab initio calculations of the momentum-resolved Eliashberg function combined with the phonon dispersion, we assign the observed peak to the out-of-plane polarized surface phonon mode.
- リンク情報
- ID情報
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- DOI : 10.1103/PhysRevB.93.085411
- ISSN : 2469-9950
- eISSN : 2469-9969
- Web of Science ID : WOS:000369728400004