2019年11月
Present status of photoemission electron microscope newly installed in SPring-8 for time-resolved nanospectroscopy
JAPANESE JOURNAL OF APPLIED PHYSICS
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- 巻
- 58
- 号
- 11
- 開始ページ
- 118001-1
- 終了ページ
- 3
- 記述言語
- 英語
- 掲載種別
- 研究論文（学術雑誌）
- DOI
- 10.7567/1347-4065/ab4b12
- 出版者・発行元
- IOP PUBLISHING LTD
A photoemission electron microscope (PEEM) system has been newly installed at the soft X-ray undulator beamline (BL17SU) of SPring-8 to realize time-resolved nanospectroscopy for the local transient electronic structures of advanced materials. This PEEM is a versatile machine composed of an electrostatic lens system and is intended for use in specific experiments such as time-resolved measurements. Pump-probe measurements in tandem with a femtosecond pulsed-laser system and an X-ray chopper are now readily available. (C) 2019 The Japan Society of Applied Physics
- リンク情報
- ID情報
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- DOI : 10.7567/1347-4065/ab4b12
- ISSN : 0021-4922
- eISSN : 1347-4065
- Web of Science ID : WOS:000503395400001