論文

2008年

Frequency stabilization of an external cavity diode laser - Countermeasures against atmospheric temperature variations

PHYSICS AND SIMULATION OF OPTOELECTRONIC DEVICES XVI
  • Yuta Minabe
  • ,
  • Kohei Doi
  • ,
  • Takashi Sato
  • ,
  • Takeo Maruyama
  • ,
  • Masashi Ohkawa
  • ,
  • Tsuneya Tsubokawa

6889
開始ページ
688918
終了ページ
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.1117/12.761598
出版者・発行元
SPIE-INT SOC OPTICAL ENGINEERING

External cavity diode lasers (ECDL) are presently experiencing a surge in popularity, as laser light-sources for advanced optical measurement systems. While these devices normally require external optical-output controls, we simplified the setup, a bit, by adding a second external cavity. This technique boasts the added advantage of having a narrower oscillation-linewidth than would be achievable, using a single optical feedback. Because drive-current and atmospheric temperature directly impact the ECDL systems' oscillation frequency, during frequency stability checks, it was necessary, in this instance, to construct a slightly smaller ECDL system, which we mounted on a Super-Invar board, to minimize the influence of thermal expansion. Taking these and other aggressive and timely measures to prevent atmospheric temperature-related changes allowed us to achieve an improvement in oscillation-frequency stability, i.e., to obtain the square root of Allan variance sigma =2 x 10(-10), at averaging time tau = 10(-1).
We introduced a vertical-cavity surface-emitting laser (VCSEL) to the setup, for the simple reason that its frequency is far less susceptible to changes in temperature, than other lasers of its type. And, because VCSELs are widely available, and the ECDL systems that use them improve frequency stability, we replaced the Fabry-Perot semiconductor laser with a VCSEL.

リンク情報
DOI
https://doi.org/10.1117/12.761598
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000255942900026&DestApp=WOS_CPL
ID情報
  • DOI : 10.1117/12.761598
  • ISSN : 0277-786X
  • Web of Science ID : WOS:000255942900026

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