MISC

1996年7月

High sensitivity of positron-annihilation induced Auger-electron spectroscopy to surface impurities

APPLIED SURFACE SCIENCE
  • T Ohdaira
  • ,
  • R Suzuki
  • ,
  • T Mikado
  • ,
  • H Ohgaki
  • ,
  • M Chiwaki
  • ,
  • T Yamazaki
  • ,
  • M Hasegawa

100
開始ページ
73
終了ページ
76
記述言語
英語
掲載種別
DOI
10.1016/0169-4332(96)00260-7
出版者・発行元
ELSEVIER SCIENCE BV

We have carried out positron-annihilation induced Auger-electron spectroscopy (PAES) for a basal plane surface of MoS2 as an example for a layered material. It is found that PAES is very sensitive to the impurities on the surface compared with the conventional (electron excited) Auger-electron spectroscopy. It is known that the basal plane of MoS2 is inert to oxygen. However, when the surface was exposed to O-2 gas, a strong Auger peak from oxygen appeared in the PAES spectrum. The present results suggest that positrons are trapped efficiently at surface defects such as vacancies and steps where the impurities are adsorbed preferentially.

リンク情報
DOI
https://doi.org/10.1016/0169-4332(96)00260-7
J-GLOBAL
https://jglobal.jst.go.jp/detail?JGLOBAL_ID=200902196805437603
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:A1996VD64000016&DestApp=WOS_CPL
URL
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0030564493&origin=inward
ID情報
  • DOI : 10.1016/0169-4332(96)00260-7
  • ISSN : 0169-4332
  • J-Global ID : 200902196805437603
  • SCOPUS ID : 0030564493
  • Web of Science ID : WOS:A1996VD64000016

エクスポート
BibTeX RIS