Two-types of beam-extraction intense light ion diodes have been investigated. One was a single stage applied-B ion diode that installed on a simple coaxial pulsed power machine Reiden-IV (1 MV, 1 TW, 50 ns). We have measured a beam flux and a beam divergence angle simultaneously with spatial resolution using a newly developed arrayed ion pinhole camera (APC). Measured data show some relation between the distribution of beam divergence and beam flux. This result implies an importance of this type of diagnostics for studying light ion diode. Experiments of another type of diode, a two-stage ion diode, were performed on an induction adder accelerator Reiden–SHVS (2 MV +2 MV, 0.2-TW, 100-ns). In this diode, the output beam of first stage is injected into the second stage diode. The operation of the second diode is controlled by the injected beam. The shadow-box measurements in the two-stage diode indicates an improvement of beam divergence (half width full maximum) from 52 ± 18 mrad to 27 ± 6 mrad due to the acceleration at the second diode. This improvement of beam divergence was in agreement with a calculated value using voltages of the first and the second stage diode. © 1993 IEEE