MISC

2004年10月

Periodic precipitation of crystalline Ge nanoparticles in Ge-B-SiO2 thin glass films

APPLIED PHYSICS LETTERS
  • H Nishiyama
  • ,
  • Miyamoto, I
  • ,
  • S Matsumoto
  • ,
  • M Saito
  • ,
  • K Fukumi
  • ,
  • K Kintaka
  • ,
  • J Nishii

85
17
開始ページ
3734
終了ページ
3736
記述言語
英語
掲載種別
DOI
10.1063/1.1812369
出版者・発行元
AMER INST PHYSICS

Crystalline 20- to 40-nm-diam Ge nanoparticles were precipitated periodically in Ge-B-SiO2 thin glass films fabricated by the plasma-enhanced chemical vapor deposition method. Such a periodic structure was created by exposure to an interference pattern with a KrF excimer laser (248 nm wavelength) and successive annealing at 600degreesC. Nanoparticles were precipitated predominantly in the unirradiated region after photoinduced refractive index change was erased completely after annealing up to 500degreesC. (C) 2004 American Institute of Physics.

リンク情報
DOI
https://doi.org/10.1063/1.1812369
CiNii Articles
http://ci.nii.ac.jp/naid/80017005571
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000224798700027&DestApp=WOS_CPL
ID情報
  • DOI : 10.1063/1.1812369
  • ISSN : 0003-6951
  • CiNii Articles ID : 80017005571
  • Web of Science ID : WOS:000224798700027

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