1994年
Site exchange mechanism in surfactant-mediated epitaxial growth
Physical Review Letters
- 巻
- 73
- 号
- 3
- 開始ページ
- 460
- 終了ページ
- 463
- 記述言語
- 英語
- 掲載種別
- DOI
- 10.1103/PhysRevLett.73.460
The energetics of site exchange in surfactant-mediated epitaxial growth is investigated using first-principles calculations for the homoepitaxy of Si/Si(001) with an As monolayer. We find that the interaction between Si dimers on the As-terminated Si(001) surface repels the Si dimers from each other and initiates site exchange between the top-layer Si atoms and the second-layer As atoms. The origin of the site exchange is the second-layer rebonding in the resulting geometries. These chemical effects of the As surfactant prevent Si islanding
this is also valid for Ge/Si heteroepitaxy. © 1994 The American Physical Society.
this is also valid for Ge/Si heteroepitaxy. © 1994 The American Physical Society.
- ID情報
-
- DOI : 10.1103/PhysRevLett.73.460
- ISSN : 0031-9007
- identifiers.cinii_nr_id : 9000239248799
- SCOPUS ID : 0000146784