MISC

1994年

Site exchange mechanism in surfactant-mediated epitaxial growth

Physical Review Letters
  • Takahisa Ohno

73
3
開始ページ
460
終了ページ
463
記述言語
英語
掲載種別
DOI
10.1103/PhysRevLett.73.460

The energetics of site exchange in surfactant-mediated epitaxial growth is investigated using first-principles calculations for the homoepitaxy of Si/Si(001) with an As monolayer. We find that the interaction between Si dimers on the As-terminated Si(001) surface repels the Si dimers from each other and initiates site exchange between the top-layer Si atoms and the second-layer As atoms. The origin of the site exchange is the second-layer rebonding in the resulting geometries. These chemical effects of the As surfactant prevent Si islanding
this is also valid for Ge/Si heteroepitaxy. © 1994 The American Physical Society.

リンク情報
DOI
https://doi.org/10.1103/PhysRevLett.73.460
ID情報
  • DOI : 10.1103/PhysRevLett.73.460
  • ISSN : 0031-9007
  • identifiers.cinii_nr_id : 9000239248799
  • SCOPUS ID : 0000146784

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