論文

査読有り
2022年4月

In vitro hemocompatibility investigation for the development of low-flow centrifugal blood pumps with less platelet clogging

INTERNATIONAL JOURNAL OF ARTIFICIAL ORGANS
  • Akiko Oota-Ishigaki
  • ,
  • Takashi Yamane
  • ,
  • Daisuke Sakota
  • ,
  • Ryo Kosaka
  • ,
  • Osamu Maruyama
  • ,
  • Masahiro Nishida

45
4
開始ページ
431
終了ページ
437
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1177/03913988211052570
出版者・発行元
SAGE PUBLICATIONS LTD

Low-flow blood pumps rated under 1 L/min are emerging for new medical applications, such as hemofiltration in acute use. In those pumps, platelet adhesion and aggregation have to be carefully considered because of clogging risk in the filter part. To find an acceptable hemocompatibility that can be applied to low-flow centrifugal blood pump design, the platelet aggregation index, clogging on a micromesh filter, and the hemolysis index were investigated using a low-flow blood pump designed for hemofiltration use. We conducted circulation testing in vitro using fresh porcine blood and two centrifugal pumps with different impeller inlet shapes. The Negative Log Platelet Aggregation Threshold Index (NL-PATI), which reflects the ability of residual platelets to aggregate, and flow rate were measured during reflux for 60 min, and the Normalized Index of Hemolysis (NIH (g/20 min)) was calculated. In addition, blood cell clogging after reflux was observed on the micromesh filter by SEM, and the adhesion rate was calculated. Our results showed that the platelet clogging on the micromesh filter occurred when the average NL-PATI was greater than 0.28 and the average NIH (g/20 min) was greater than 0.01. In contrast, platelet clogging on the micromesh was suppressed when NL-PATI was less than 0.17 and the NIH (g/20 min) was less than 0.003. These values might be used as acceptable hemocompatibility of low-flow centrifugal blood pumps with suppressed platelet clogging for hemofiltration pumps.


リンク情報
DOI
https://doi.org/10.1177/03913988211052570
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000713216500001&DestApp=WOS_CPL
ID情報
  • DOI : 10.1177/03913988211052570
  • ISSN : 0391-3988
  • eISSN : 1724-6040
  • Web of Science ID : WOS:000713216500001

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