中村 國臣

電気・電子工学大百科事典第5巻 電子デバイス第2編電子部品 

電気書院  

日本信頼性学会編：信頼性ハンドブック 

日科技連  

Change of the equivalent circuit constants accompanied by the degradation and recovery of efficiency on a-Si solar cells 

2nd World Conf. & Exh. on PSEC, Vienna, pp.652 (1998)  

A statistical consideration on the degradation model of a-Si:H solar cells 

Technical Report of the Institute of Electronics, Information and Communication Engineers, R94-31 (1994-10) (in Japanese)  

A Prediction Method of Degradation of a-Si:H Solar Cells 

Technical Digest of the International PVSEC-5, Kyoto, Japan, pp.359-362, (1990)  

マルコフ技術の応用について 

REAJ誌 Vol.22, No.6, p.555(2000)  

IEC60050(191)とJIS用語 

REAJ誌 Vol.22, No.6, p.504(2000)  

Change of the equivalent circuit constants accompanied by the degradation and recovery of efficiency on a-Si solar cells 

2nd World Conf. & Exh. on PSEC, Vienna, pp.652 (1998)  

A statistical consideration on the degradation model of a-Si:H solar cells 

Technical Report of the Institute of Electronics, Information and Communication Engineers, R94-31 (1994-10) (in Japanese)  

A Prediction Method of Degradation of a-Si:H Solar Cells 

Technical Digest of the International PVSEC-5, Kyoto, Japan, pp.359-362, (1990)