論文

2009年12月

Correlations between antibunching and blinking of photoluminescence from a single CdSe quantum dot

EUROPEAN PHYSICAL JOURNAL D
  • X. S. Xu
  • ,
  • T. Yamada
  • ,
  • S. Yokoyama

55
3
開始ページ
691
終了ページ
697
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1140/epjd/e2009-00266-6
出版者・発行元
SPRINGER

The antibunching and blinking from a single CdSe/ZnS nanocrystal with an emission wavelength of 655 nm were investigated under different excitation powers. The decay process of the photoluminescence from nanocrystal was fitted into a stretched exponential, and the small lifetime and the small stretching exponent under a high excitation power were explained by using nonradiative multi-channel model. The probability of distributions for off-times from photoluminescence intermittence was fitted into the power law, and the power exponents were explained by using a tunneling model. For higher excitation power, the Auger-assisted tunneling model takes effect, where the tunneling rate increases and the observed lifetime decreases. For weak excitation power, the electron directly tunnels between the nanocrystal and trapping state without Auger assistance. The correlation between antibunching and blinking from the same nanocrystal was analyzed.

リンク情報
DOI
https://doi.org/10.1140/epjd/e2009-00266-6
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000271939500018&DestApp=WOS_CPL
URL
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=71449093955&origin=inward
ID情報
  • DOI : 10.1140/epjd/e2009-00266-6
  • ISSN : 1434-6060
  • SCOPUS ID : 71449093955
  • Web of Science ID : WOS:000271939500018

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