論文

査読有り
2007年7月

InP/InGaAs hot electron transistors with insulated gate

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
  • Akira Suwa
  • ,
  • Takashi Hasegawa
  • ,
  • Takahiro Hino
  • ,
  • Hisashi Saito
  • ,
  • Masaya Oono
  • ,
  • Yasuyuki Miyamoto
  • ,
  • Kazuhito Furuya

46
25-28
開始ページ
L617
終了ページ
L619
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1143/JJAP.46.L617
出版者・発行元
INST PURE APPLIED PHYSICS

Elimination of the base layer in conventional hot electron transistor has possibility to minimize the scattering in the propagation. In previous study, we fabricated InP/InGaAs hot electron transistors without a doped layer in the propagation region by fabricating a 25-nm-wide emitter and Schottky gate electrodes located at both sides of an emitter mesa. However, there were some problems in fabricated device. To solve these observed problems, we proposed and fabricated a new structure with hot electrons propagating only in the intrinsic semiconductor. An insulated gate was introduced in hot electron transistors, in which hot electrons are propagated only in the intrinsic region after extraction from a heterostructure launcher. Clear collector current modulation by the insulated gate and a current density of 160kA/cm(2) were confirmed.

リンク情報
DOI
https://doi.org/10.1143/JJAP.46.L617
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000248427200007&DestApp=WOS_CPL
ID情報
  • DOI : 10.1143/JJAP.46.L617
  • ISSN : 0021-4922
  • Web of Science ID : WOS:000248427200007

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