論文

査読有り
2013年4月

High Open-Circuit Voltage Gain in Vertical InGaAs Channel Metal-Insulator-Semiconductor Field-Effect Transistor Using Heavily Doped Drain Region and Narrow Channel Mesa

JAPANESE JOURNAL OF APPLIED PHYSICS
  • Masashi Kashiwano
  • ,
  • Jun Hirai
  • ,
  • Shunsuke Ikeda
  • ,
  • Motohiko Fujimatsu
  • ,
  • Yasuyuki Miyamoto

52
4
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.7567/JJAP.52.04CF05
出版者・発行元
JAPAN SOC APPLIED PHYSICS

We fabricated a vertical metal-insulator-semiconductor field-effect transistor (MISFET) with a heterostructure launcher and an undoped channel. Vertical MISFETs exhibit a high drain current density; however, their large output conductance is a disadvantage for the open-circuit voltage gain. In a previous study, a maximum voltage gain of 4.0 was found in a vertical MISFET with a heavily doped drain region and a 45-nm-wide channel mesa. The heavily doped drain region and a narrower channel width are effective in reducing the output conductance. In this study, we fabricated a device with the heavily doped drain region and a 23-nm-wide channel mesa structure. It was observed that the output conductance decreased from 120 to 57 mS/mm at a drain current density of 0.3 MA/cm(2) with a narrower channel mesa. The maximum open-circuit voltage gain increased from 4.0 to 5.7. (C) 2013 The Japan Society of Applied Physics

リンク情報
DOI
https://doi.org/10.7567/JJAP.52.04CF05
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000320002400082&DestApp=WOS_CPL
ID情報
  • DOI : 10.7567/JJAP.52.04CF05
  • ISSN : 0021-4922
  • Web of Science ID : WOS:000320002400082

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