2002年3月
Secondary electron yield from an Al surface bombarded by 20-80 keV Ar+ ions
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN
- ,
- ,
- 巻
- 71
- 号
- 3
- 開始ページ
- 773
- 終了ページ
- 776
- 記述言語
- 英語
- 掲載種別
- DOI
- 10.1143/JPSJ.71.773
- 出版者・発行元
- PHYSICAL SOC JAPAN
A secondary electron yield from a polycrystalline A1 surface was measured under Ar+ bombardment. The yield of negatively charged particles gamma(theta) was measured as a function of steady state oxygen coverage theta of target surfaces during Ar+ bombardment. Projectile energy was changed from 20 to 80 keV. The absolute value of effective oxygen coverage theta of a target surface was determined ill situ by means of an optical spectroscopic technique in which light intensities emitted by sputtered excited atoms from the target was measured as a function of current densities of the projectile. Absolute yield of secondary electrons at zero oxygen coverage, gamma(0), was obtained by measuring yield variation as a function of theta.
- リンク情報
- ID情報
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- DOI : 10.1143/JPSJ.71.773
- ISSN : 0031-9015
- CiNii Articles ID : 110001971629
- Web of Science ID : WOS:000174586700023