論文

査読有り
2004年2月

Contraction and reexpansion of polymer thin films

PHYSICAL REVIEW E
  • T Miyazaki
  • ,
  • K Nishida
  • ,
  • T Kanaya

69
2
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1103/PhysRevE.69.022801
出版者・発行元
AMER PHYSICAL SOC

We report x-ray reflectivity measurements on polystyrene thin films supported on silicon wafer. In annealing experiments, we found fast and slow contraction processes in the thin films above the glass transition temperature. The former is the normal relaxation (annealing) process observed in bulk, and the latter is unexpected and enhanced in thin films below similar to20 nm. In addition, we found unexpected extremely slow reexpansion processes in the glassy state. These unexpected very slow processes are discussed in terms of lateral contraction and expansion processes driven by entropic changes at the interfaces and the difference of the expansivities between polystyrene and silicon wafer.

リンク情報
DOI
https://doi.org/10.1103/PhysRevE.69.022801
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000220255400086&DestApp=WOS_CPL
ID情報
  • DOI : 10.1103/PhysRevE.69.022801
  • ISSN : 1539-3755
  • Web of Science ID : WOS:000220255400086

エクスポート
BibTeX RIS