2007年2月
X-ray reflectivity studies on glass transition of free standing polystyrene thin films
EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS
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- ,
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- 巻
- 141
- 号
- 開始ページ
- 203
- 終了ページ
- 206
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1140/epjst/e2007-00041-y
- 出版者・発行元
- SPRINGER HEIDELBERG
We have studied thermal expansion of free standing polystyrene thin films using X-ray reflectivity to elucidate the glass transition temperature and the thermal expansivity. We found that the glass transition temperature T(g) decreased with the film thickness, depending on molecular weight. The reduction in the free standing films is much larger than in the supported films on Si substrate, suggesting that some segmental motions are activated due to free surfaces on both sides in the free standing films. We also found that the thermal expansivity in the glass and the melt decreased with the film thickness. This decrease must be attributable to chain confinement effects.
- リンク情報
- ID情報
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- DOI : 10.1140/epjst/e2007-00041-y
- ISSN : 1951-6355
- Web of Science ID : WOS:000245472000035