MISC

2002年2月

Determination of porosity of TiO2 films from reflection spectra

JOURNAL OF THE ELECTROCHEMICAL SOCIETY
  • T Matsubara
  • ,
  • T Oishi
  • ,
  • A Katagiri

149
2
開始ページ
C89
終了ページ
C93
記述言語
英語
掲載種別
DOI
10.1149/1.1430718
出版者・発行元
ELECTROCHEMICAL SOC INC

Reflection spectra of TiO2 films on titanium substrates were measured at different incident angles of visible light (wavelength 400-800 nm). Porosities of the TiO2 films were estimated from the refractive indexes of the films which were determined from the dependency of the interference wavelength on the incident angle. Porous TiO2 films formed in NaOH solutions mostly exhibit refractive indexes smaller than 2.1, indicating that the porosity is greater than 30%. As the porosity increases, the refractive index becomes less dependent on wavelength. The porosities determined from reflection spectra are in good agreement with the pore space ratios obtained by the density profile analysis of scanning electron microscopic images. (C) 2001 The Electrochemical Society. [DOI: 10.1149/1.1430718] All rights reserved.

Web of Science ® 被引用回数 : 12

リンク情報
DOI
https://doi.org/10.1149/1.1430718
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000173853800030&DestApp=WOS_CPL

エクスポート
BibTeX RIS