論文

査読有り
2006年6月

Current limiting characteristics of inductive type SCFCL with ZnO device and resistor in parallel

IEEE Transactions on Applied Superconductivity
  • Yasuyuki Shirai
  • ,
  • Takayuki Morimoto
  • ,
  • Kunimitsu Furushiba
  • ,
  • Masahiro Shiotsu
  • ,
  • Keisuke Fushiki
  • ,
  • Junpei Baba
  • ,
  • Tanzo Nitta

16
2
開始ページ
654
終了ページ
657
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.1109/TASC.2006.870524
出版者・発行元
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

A new FCL system which consists of a L-type SCFCL in parallel with a resistor and a ZnO device is proposed. The proposed system limits the fault current inductively and also consumes excessive energy like R-type ones. A model system was made and studied experimentally. The ZnO device is off-state in stand-by mode. When a fault occurs, the SCFCL turns into current limiting mode and has high impedance. The voltage across the SCFCL exceeds a threshold voltage of the ZnO device. During one cycle of the voltage, the ZnO device is on-state around the peak of the voltage, and the current flows through both the SCFCL and the resistor. A certain amount of excessive energy is dissipated in the resistor. The ZnO device is off-state around the peak of the current which is suppressed only by the L-type SCFCL. Finally the proposed FCL system switches L-type and L+R-type in a cycle. Relations among the threshold voltage, the current limiting impedance and the resistance of the resistor were discussed. It was confirmed the proposed FCL system represents desirable current limiting characteristics. © 2006 IEEE.

リンク情報
DOI
https://doi.org/10.1109/TASC.2006.870524
J-GLOBAL
https://jglobal.jst.go.jp/detail?JGLOBAL_ID=201302226456861477
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000244804100141&DestApp=WOS_CPL
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33746614412&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=33746614412&origin=inward
ID情報
  • DOI : 10.1109/TASC.2006.870524
  • ISSN : 1051-8223
  • J-Global ID : 201302226456861477
  • SCOPUS ID : 33746614412
  • Web of Science ID : WOS:000244804100141

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