2006年6月
Current limiting characteristics of inductive type SCFCL with ZnO device and resistor in parallel
IEEE Transactions on Applied Superconductivity
- ,
- ,
- ,
- ,
- ,
- ,
- 巻
- 16
- 号
- 2
- 開始ページ
- 654
- 終了ページ
- 657
- 記述言語
- 英語
- 掲載種別
- 研究論文(国際会議プロシーディングス)
- DOI
- 10.1109/TASC.2006.870524
- 出版者・発行元
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
A new FCL system which consists of a L-type SCFCL in parallel with a resistor and a ZnO device is proposed. The proposed system limits the fault current inductively and also consumes excessive energy like R-type ones. A model system was made and studied experimentally. The ZnO device is off-state in stand-by mode. When a fault occurs, the SCFCL turns into current limiting mode and has high impedance. The voltage across the SCFCL exceeds a threshold voltage of the ZnO device. During one cycle of the voltage, the ZnO device is on-state around the peak of the voltage, and the current flows through both the SCFCL and the resistor. A certain amount of excessive energy is dissipated in the resistor. The ZnO device is off-state around the peak of the current which is suppressed only by the L-type SCFCL. Finally the proposed FCL system switches L-type and L+R-type in a cycle. Relations among the threshold voltage, the current limiting impedance and the resistance of the resistor were discussed. It was confirmed the proposed FCL system represents desirable current limiting characteristics. © 2006 IEEE.
- リンク情報
-
- DOI
- https://doi.org/10.1109/TASC.2006.870524
- J-GLOBAL
- https://jglobal.jst.go.jp/detail?JGLOBAL_ID=201302226456861477
- Web of Science
- https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000244804100141&DestApp=WOS_CPL
- Scopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33746614412&origin=inward
- Scopus Citedby
- https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=33746614412&origin=inward
- ID情報
-
- DOI : 10.1109/TASC.2006.870524
- ISSN : 1051-8223
- J-Global ID : 201302226456861477
- SCOPUS ID : 33746614412
- Web of Science ID : WOS:000244804100141