論文

査読有り
2008年2月

Development of low energy ion beam system for space charge compensation experiments

REVIEW OF SCIENTIFIC INSTRUMENTS
  • Mitsuaki Takeuchi
  • ,
  • Yasuhito Gotoh
  • ,
  • Hiroshi Tsuji
  • ,
  • Junzo Ishikawa
  • ,
  • Shigeki Sakai

79
2
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1063/1.2801549
出版者・発行元
AMER INST PHYSICS

A low energy ion beam system for space charge compensation (SCC) experiments was developed and evaluated. This system was designed for observation of SCC of a positive ion beam with an electron beam. The system consisted of the ion source chamber and the SCC experiment chamber. The ion source chamber was equipped with the compact microwave ion source for low voltage extraction. Ion current at initial position of the analysis chamber was 84 mu A at extraction voltage of 500 V, and satisfied a condition to observe the SCC effect clearly. In order to evaluate the SCC, we measured the arrival ion current by supplying thermionic electrons, which were extracted from a tungsten filament driven by ac voltage. As the electron supply, the arrival ion current increased from 40 to 68 mu A at the potential of filament of +3 eV which produced the thermionic electron with extremely low energy extracted by space charge of the ion beam. (C) 2008 American Institute of Physics.

リンク情報
DOI
https://doi.org/10.1063/1.2801549
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000254194800114&DestApp=WOS_CPL
ID情報
  • DOI : 10.1063/1.2801549
  • ISSN : 0034-6748
  • Web of Science ID : WOS:000254194800114

エクスポート
BibTeX RIS