We describe the measurement of detailed and precise Pixel Response Functions (PRFs) of a fully depleted CCD. Measurements were performed under different physical conditions, such as different wavelength light sources or CCD operating temperatures. We determined the relations between these physical conditions and the forms of the PRF. We employ two types of PRFs: one is the model PRF (mPRF) that can represent the shape of a PRF with one characteristic parameter and the other is the simulated PRF (sPRF) that is the resultant PRF from simulating physical phenomena. By using measured, model, and simulated PRFs, we determined the relations between operational parameters and the PRFs. Using the obtained relations, we can now estimate a PRF under conditions that will be encountered during the course of Nano-JASMINE observations. These estimated PRFs will be utilized in the analysis of the Nano-JASMINE data.