Masayoshi Yamada - My portal - researchmap

Profile Information

Affiliation: Former Institution / Organization Kyoto Institute of Technology Graduate School of Science and Technology

Degree: Doctor of Engineering(Osaka University)
Master of Engineering(Kobe University)

J-GLOBAL ID: 200901073009898005
researchmap Member ID: 1000029304

External link: http://elcirc.dj.kit.ac.jp

Research Areas

4

Manufacturing technology (mechanical, electrical/electronic, chemical engineering) / Electronic devices and equipment /
Manufacturing technology (mechanical, electrical/electronic, chemical engineering) / Electric/electronic material engineering /
Nanotechnology/Materials / Crystal engineering /
Nanotechnology/Materials / Applied materials /

Research History

10

1986 - 1994

Kyoto Institute of Technology
1986 - 1994

Kyoto Institute of Technology, Associate professon
1994

- 京都工芸繊維大学教授
1994

- Kyoto Institute of Technology, Professon
1985 - 1986

Kobe University
1985 - 1986

Kobe University, Lecturer
1976 - 1985

Kobe University
1976 - 1985

Kobe University, Reseach Associate
1973 - 1976

Osaka University
1973 - 1976

Osaka University Reseach Associate

Education

4

- 1973

Osaka University
- 1973

Electronics, Graduate School, Division of Engineering, Osaka University
- 1968

Faculty of Engineering, Kobe University
- 1968

Electrieal Engineering, Faculty of Engineering, Kobe University

Awards

2

1997

医用画像情報学会内田論文賞
1995

医用画像情報学会内田論文賞

Misc.

127

Micro-Raman characterization of starting material for traveling liquidus zone growth method

MR Islam, P Verma, M Yamada, M Tatsumi, K Kinoshita

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 41(2B) 991-995, Feb, 2002
赤外光弾性法を用いた半導体ウェハ・チップ中のひずみ分布測定

材料, 51(9) 699-970, 2002
Two-dimensional mapping of resistivity in semi-insulating GaAs wafers with large diameter using a nondestructive technique

Abst.of 29th Int.Conf.on Compound Semiconductors, 2002
Photoluminescence from deep levels in Fe-doped InP substrares

Abst.of 29th Int.Conf.on Compound Semiconductors, 2002
Photoluminescence and Raman characterization of polycrystalline In_{xGa_1-xAs feed material for traveling liquidus zone method}

Abstracts of 5th China-Japan Workshop on Microgravity Science, 22, 2002
Two-dimensional mapping of composition in bulk In_{xGa_1-xAs crystals using photoluminescence}

Abstracts of the XIIth Semicond.and Insulating Materials Conference, 69-70, 2002
A step forward to the growth and characterization of compositionally homogeneous In_{xGa_1-xAs bulk crystal}

Abstracts of the XIIth Semicond.and Insulationg Materials Conference, 37-38, 2002
Inspection of residual strain in GaAs single crystal as sstandard ingot form

Abstracts of the XIIth Semicond and Insulationg Materials Conference, 16, 2002
Optical anisotropy in dislocation-free silicon single crystals

Abstracts of the 8th IUMRS Conf.on Electronic Materials, 486, 2002
Evaluation of 4" Fe-doped InP wafers using a scanning photoluminescence technique

Abstracts of the 8th IUMRS Int.Conf.on Electronic Materials, 170, 2002
Strain in bulk In_{xGa_1-xAs crystals with gradual variation in composition}

Abstracts of the 8th IUMRS Int.Conf. on Electronic Materials, 140, 2002
Laser patterning of electronic circuit board

Tech.Digest of the 3rd Int. Conf. on Laser Precision Microfabrication, 111, 2002
Micro-Raman and photoluminescence characterization of polycrystallization in bulk In_xGa_1-xAs crystals

Proc.of the 14th Int.Conf.onInP and Related Materials, IEE E Cat. #02CH37307, 409-412, 2002
Pseudo-three-dimensional photoelastic characterization of LEC-GaAs single crystal ingot

Inst.Phys.Conf.Ser., 175, 681-687, 2002
Raman Scattering from Wurtzite GaN Bulk Crystal

Materials Science Forum, 389-393, 1501-1504, 2002
Nondestructive measurement of resistivity in bulk In_xGa_1-xAs crystals

Materials Science & Engineering, B 91-92, 376-378, 2002
Optical anisotropy and strain-induced birefringence in dislocation-free silicon single crystals

Materials Science & Engineering, B 91-92, 174-177, 2002
The Influence of Residual Strain on Raman Scattering in In_xGa_1-xAs Single Crystals（共）

Materials Science & Engineering, B 91-92, 66-69, 2002
Raman studies on GaAs1-xBix and InAs1-xBix

Prabhat Verma, K. Oe, M. Yamada, H. Harima, M. Herms, G. Irmer

Journal of Applied Physics, 89(3) 1657-1663, Feb 1, 2001
Raman characerization of compositionally graded bulk InGaAs crystal

Abstracts of the 13th Int.Conf.on Crystal growth, 364, 2001

More

Books and Other Publications

4

Dislocation bundles in GaAs substrates : an X-ray, and Makyoh topography, X-ray diffraction, TEM, scanning infrared polariscopy, light interferometry, and Nomarski microscopy(共著)

Proc. of Microsc. Scmicond. Mater.; Inst. Phys. Conf. Ser.No.164, 1999
Thermally-Assisted Pulsed-Laser Annealing of SOS (共著)

Laser and Electron-Beam Solid Interactions and Materials Processing, 1981
TIME-RESOLVED CONDUCTIVITY AND REFLECTIVITY DURING LASER ANNEALING OF SEMICONDUCTORS (共著)

Proc. of the 15th Int. Conf. on the Physics of Semiconductors, Journal of the Physical Society of Japan, 1980
BRILLOUIN SCATTERING STUDY OF INTENSE PHONON BEAMS IN CbS (共著)

Proc. of Satellite Symp. of the 8th Int. Cong. on Acoustics on Microwave Acoustics, 1974

Professional Memberships

6

Works

12

混晶系半導体の光学的評価

2000 - 2002
Optical Characterizations of Semiconductor Mixer Crystals

2000 - 2002
低歪み化合物半導体の残留歪みに関する研究

1999 - 2001
Study on Residual Strain in Compound Semiconductors with Low Strain Level

1999 - 2001
In x Ga_1-xAs結晶の混晶比と残留歪みの評価に関する研究

1999 - 2000
LN結晶欠陥の非破壊検出とLN光変調器特性に関する研究

1999 - 2000
角度センサに関する研究

1999 - 2000
Study on Composition and Residual Strain in In x Ga_1-x As cvystals

1999 - 2000
Study on nondestructive inspection of LN crystal defects and LN optical modulation characteristics

1999 - 2000
Study on Tilt Sensor

1999 - 2000
超音波医用動画像のリアルタイム処理と新生児診断支援システム開発

1997 - 1998
Real Time Processing of Ultrasonic Moving Images and Development of New born Baby Diognosis System

1997 - 1998

Research Projects

10

レーザー加工

2001 - 2005
Laser Processing

2001 - 2005
医用画像処理

1994 - 2003
Medical Image Processing

1994 - 2003
電子材料のレーザー加工
半導体材料・デバイスの光学的評価
半導体材料とデバイスの光学的評価
Laser Processing of Electronic Materials
Optical Characterization of Semiconductor Materials and Devices
Optical Characterization of Semiconductors Materials and Devices