杉山 和久

SPV(Surface Photo-voltage)スペクトロスコピーによる超精密加工表面評価法の開発 

精密工学会誌 66(4) 630-634 2000年  

Development of Surface State Evaluation Method by High Precision Photo-Reflectance Spectrum Measurement 

TECHNOLOGY REPORTS OF THE OSAKA UNIVERSITY 50(2372) 49 2000年  

First-Principles Molecular-Dynamics Simulations of Etching Process by Off Molecules 

TECHNOLOGY REPORTS OF THE OSAKA UNIVERSITY 50(2371) 33 2000年  

Development of Evaluation Method for Ultra Precision Machined Surface by SPV(Surface Photo-voltage)Spectroscopy 

Journal of the Japan Society of Precision Engineering 66(4) 630 2000年  

Chemisorpution of OH on the H-terminated Si(001) 

Computational Materials Science 14(1/4) 77-79 1999年  

A Study of EEM(Elastic Emission Machining)-Influence of Dissolved Oxygen to Si Wafer Surface- 

Journal of the Japan Society of Precision Engineering 64(6) 907-912 1998年  

EEM(Elastic Emission Machining)加工機構の第一原理分子動力学シミュレーション 

DV-Xα研究協会会報 10(2) 45 1997年  

実空間差分法を用いた二原子分子の電子状態計算 

DV-Xα研究協会会報 10(2) 40 1997年  

Ab initio Emission Dynamics Simulation of Machining Mechanism in EEM(Elastic Emission Machining) 

Bulletin of the Society for Discrete Variational Xα 10(2) 45 1997年  

Electronic structure calculation of diatomic molecule using real-space finite difference method 

Bulletin of the Society for Discrete Variational Xα 10(2) 40 1997年  

First-princilpes Molecular Dynamics Simulations of H-terminated Si(001)Surfaces Interacting with OH Molecules 

Institute for Numerical Simulation and Applied Mathematics Symposium 1997年  

First-Principles simulations of removal process in EEM (Elastic Emission Machining) 

Abstracts and program IUMRS-ICA-97 578 1997年  

Chemisorption of OH on the H-terminated Si(001) 

Abstracts and program IUMRS-ICA-97 555 1997年  

Characterization of Surface States by Photo-reflectance Spectra -Comparison between Experimental Dependence on Sunface Orientation and its Calculated Results- 

Proceedings of 1996 the Japan-China Bilateral Symposium on Advanced Manufacturing Engineering 197 1996年  

Investigation of Surface States on Si(001) and Si(111) Surfaces -Photo-reflectance Measurement and Ab-initio Calculation- 

Preprint of the Materials Research Society of Japan 189 1996年