MISC

2003年8月

Enhanced field emission of boron nitride nanofilms on roughened GaN substrates

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
  • HT Luo
  • ,
  • S Funakawa
  • ,
  • WZ Shen
  • ,
  • T Sugino

42
8B
開始ページ
L996
終了ページ
L998
記述言語
英語
掲載種別
DOI
10.1143/JJAP.42.L996
出版者・発行元
INST PURE APPLIED PHYSICS

The field-emission (FE) characteristics of boron nitride (13N) nanofilms (8-10nm) synthesized on n-type gallium nitride (GaN) substrates are investigated. It is demonstrated that GaN is superior to Si mainly due to its lower electron affinity than Si. BN nanofilms on GaN substrates are proved to significantly improve FE in contrast to BN thick films on GaN substrates. Surface roughening is found to be applicable for nanofilms to further improve FE. An optimum turn-on electric field as low as 3.6 V/mum is obtained from the nanofilm on a roughened surface.

リンク情報
DOI
https://doi.org/10.1143/JJAP.42.L996
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000185423400004&DestApp=WOS_CPL
ID情報
  • DOI : 10.1143/JJAP.42.L996
  • ISSN : 0021-4922
  • Web of Science ID : WOS:000185423400004

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