中前幸治 (Kouji Nakamae) - マイポータル

基本情報

所属: 大阪大学大学院情報科学研究科情報システム工学専攻教授 (professor)

学位: 工学博士(大阪大学)
工学修士(大阪大学)

J-GLOBAL ID: 200901006291837057
researchmap会員ID: 1000030820

研究キーワード

研究分野

委員歴

2010年

日本信頼性学会, 評議員

論文

Accurate measurement of charge density in nanoscale particles using an aperture optimization of Fourier based phase reconstruction

Takuma Okada, Yoshihiro Midoh, Koji Nakamae, Noriyuki Miura

Proceedings of the Electronic Imaging 2022 34(14) 248-1 2022年1月査読有り
Denoising electron holograms using the wavelet hidden Markov model for phase retrieval—Applications to the phase-shifting method

Takehiro Tamaoka, Yoshihiro Midoh, Kazuo Yamamoto, Shodai Aritomi, Toshiaki Tanigaki, Masao Nakamura, Koji Nakamae, Masashi Kawasaki, Yasukazu Murakami

AIP Advances 11(2) 025135-025135 2021年2月19日査読有り
Single-pulse observation of photoemission during avalanche breakdown in insulated gate bipolar transistor

Endo, K., Chinone, N., Nakamura, T., Matsumoto, T., Nakamae, K.

Microelectronics Reliability 2020年
Temporally- And Spatially-Resolved Observations of Current Filament Dynamics in Insulated Gate Bipolar Transistor Chip during Avalanche Breakdown

Endo, K., Nakamae, K.

IEEE Transactions on Device and Materials Reliability 19(4) 2019年
Suppressing Geometric Phase Shift Owing to Antiphase Boundaries in Dark-Field Electron Holography

Youngji Cho, Kodai Niitsu, Yoshihiro Midoh, Koji Nakamae, Daisuke Shindo, Jun-Mo Yang, Yasukazu Murakami

MATERIALS TRANSACTIONS 60(5) 698-703 2019年
Thermal behavior analysis of interconnect structures of Si semiconductor devices using the temperature dependent reflectance of an incoherent light beam

Endo, K., Midoh, Y., Nakamura, T., Matsumoto, T., Koshikawa, K., Nakamae, K.

Japanese Journal of Applied Physics 57(7) 2018年
Visual Target Strategies in Infantile Nystagmus Patients With Horizontal Jerk Waveform.

Takao Imai, Yasumitsu Takimoto, Tomoko Okumura, Kayoko Higashi-Shingai, Noriaki Takeda, Koji Kitamura, Bukasa Kalubi, Takashi Fujikado, Masakazu Hirota, Yoshihiro Midoh …

Frontiers in neurology 9 622-622 2018年
A robust SEM auto-focus algorithm using multiple band-pass filters

Minoru Harada, Kenji Obara, Koji Nakamae

MEASUREMENT SCIENCE AND TECHNOLOGY 28(1) 2017年1月査読有り
Overlay improvement in nanoimprint lithography for 1x-nm patterning

Kazuya Fukuhara, Masato Suzuki, Masaki Mitsuyasu, Toshiaki Komukai, Masayuki Hatano, Takuya Kono, Tetsuro Nakasugi, Yonghyun Lim, Wooyung Jung, Koji Nakamae

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 34(6) 2016年11月査読有り
レーザー励起テラヘルツ放射イメージングを利用したLSI故障解析

山下将嗣, 大谷知行, 松本徹, 後藤安則, 斗内政吉, 中前幸治, 二川清

精密工学会誌 82(3) 225-229 2016年
Thermoreflectance mapping observation of Power MOSFET under UIS avalanche breakdown condition

Koichi Endo, Kenji Norimatsu, Tomonori Nakamura, Takashi Setoya, Koji Nakamae

MICROELECTRONICS RELIABILITY 55(9-10) 1628-1633 2015年8月査読有り
A shape-modification strategy of electron beam direct writing considering circuit performance in LSI interconnects

Yoshihiro Midoh, Atsushi Osaki, Koji Nakamae

ALTERNATIVE LITHOGRAPHIC TECHNOLOGIES VI 9049 2014年査読有り
Design and Measurement of MOSFET TEG Chips for Developing Reliability Aware EDA Software

Katsuyoshi Miura, Atsushi Kurokawa, Hiroshi Miyazaki, Koji Nakamae

Nano Testing Symposium 2013年11月査読有り
超高圧電子顕微鏡を用いた半導体デバイス解析

工藤修一, 廣瀬幸範, 西竜治, 御堂義博, 服部信美, 小山徹, 中前幸治

第33回ナノテスティングシンポジウム (NANOTS) 会議録 225-230 2013年11月査読有り
Fast and Accurate Design Based Binning Based on Hierarchical Clustering with Invariant Feature Vectors for BEOL

Katsuyoshi Miura, Yuki Soga, Koji Nakamae, Kenichi Kadota, Toshiyuki Aritake, Yuichiro Yamazaki

2013 24TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC) 7-12 2013年査読有り
A dose modification strategy of electron beam direct writing considering TDDB reliability in LSI interconnects

Yoshihiro Midoh, Atsushi Osaki, Koji Nakamae

ALTERNATIVE LITHOGRAPHIC TECHNOLOGIES V 8680 2013年査読有り
The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization

Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae

MICROELECTRONICS RELIABILITY 51(9-11) 1624-1631 2011年9月査読有り
THz emission characteristics from p/n junctions with metal lines under non-bias conditions for LSI failure analysis

Masatsugu Yamashita, Chiko Otani, Toru Matsumoto, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, Kiyoshi Nikawa, Sunmi Kim, Hironaru Murakami, Masayoshi Tonouchi

OPTICS EXPRESS 19(11) 10864-10873 2011年5月査読有り
Non-electrical-contact LSI failure analysis using non-bias laser terahertz emission microscope

Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Chiko Otani, Masayoshi Tonouchi, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae

2011 18TH IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA) 2011年査読有り
Design intent application to tolerance-based manufacturing system

Sachiko Kobayashi, Satoshi Tanaka, Suigen Kyoh, Shimon Maeda, Masanari Kajiwara, Soichi Inoue, Koji Nakamae

JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS 10(1) 2011年1月査読有り