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Dec 9, 2010

Measurement of Scattering Parameters of Devices with Waveguide Ports and Coaxial Line Ports Using Unknown "Thru" Calibration

IEICE technical report
  • SANAGI Minoru
  • ,
  • FUJIMORI Kazuhiro
  • ,
  • NOGI Shigeji

Volume
110
Number
343
First page
23
Last page
28
Language
Japanese
Publishing type
Publisher
The Institute of Electronics, Information and Communication Engineers

Measurements of scattering parameters of devices with rectangular waveguide ports and coaxial line ports have been investigated. Unknown "thru" calibration was employed for characterizing a transition for converting the coaxial line test port to the waveguide. Transmission phase of the unknown "thru" must be known to within ±90° in the calibration procedure. A transition from the coaxial line to the waveguide used as the unknown "thru" was designed with an electromagnetic field simulator, and simulated values of the transmission phase was adopted as the required known values. The scattering parameters of a waveguide section with a coaxial probe were measured with a fabricated unknown "thru."

Link information
CiNii Articles
http://ci.nii.ac.jp/naid/110008676278
CiNii Books
http://ci.nii.ac.jp/ncid/AN10013185
URL
http://id.ndl.go.jp/bib/10936810
ID information
  • ISSN : 0913-5685
  • CiNii Articles ID : 110008676278
  • CiNii Books ID : AN10013185

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