Papers

Peer-reviewed
Jul, 1993

Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits

The Transactions of the IEICE
  • Hiroyuki Michinishi
  • ,
  • Tokumi Yokohira
  • ,
  • Takuji Okamoto

Volume
Vol.E76-D, No.7, pp.791-799
Number

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